TECHNOLOGY:  

SIFT

AFFILIATION:   Aerstone Labs LLC, Rockville, Maryland, United States

TECHNOLOGY SUMMARY

Track: Cyber & Software
Area: Data Protection
Tech Readiness: TRL 8

Tech Brief: SIFT is metadata tagging software that can scan and tag documents against a centralized list of keywords (both explicit and pattern-based). SIFT supports both searchable documents, as well as non-searchable documents like pictures and video files. SIFT can also be used to scan network shares for spilled data.

FIGURES OF MERIT

Value Proposition: SIFT will allow DoD organizations to: -Obtain full value from digital assets by facilitating enterprise search and content targeting through metadata tagging; -Ensure that sensitive data in motion or at rest is properly protected, by enabling technologies like DRM and ABAC; -Periodically scan network enclaves for spilled data; and -Facilitate centralized reporting and insight into data being transferred between security enclaves.

SHOWCASE SUMMARY

Org Type: Small to Medium Enterprise
Website: http://www.aerstonelabs.com
Booth Number: T208